Full title: Adaptation Patterns and Their Associations with Mismatch Negativity: A Electroencephalogram Study with Controlled Expectations
Running title: Adaptation and MMN
Authors: Brian W. L. WONG1,2, Shuting HUO1,3, Urs MAURER1,4,5
1 Department of Psychology, The Chinese University of Hong Kong, Hong Kong, China
2 BCBL, Basque Center on Brain, Language and Cognition, Donostia-San Sebastián, Spain
3 Department of Applied Social Sciences, The Hong Kong Polytechnic University, Hong Kong, China
4 Brain and Mind Institute, The Chinese University of Hong Kong, Hong Kong, China
5 Centre for Developmental Psychology, The Chinese University of Hong Kong, Hong Kong, China
Word count: 7,608
Figure count: 6
Keywords: Adaptation, expectation, electroencephalogram (EEG), mismatch negativity (MMN), repetition positivity (RP)
Funding: This work was supported by the General Research Fund of the Research Grants Council of Hong Kong awarded to the corresponding author (RGC-GRF 14600919).
Conflict of interest: None
Ethics approval statement: This study was approved by The Joint Chinese University of Hong Kong–New Territories East Cluster Clinical Research Ethics Committee (The Joint CUHK-NTEC CREC) (reference no.: 2019.048)
Author Note
Address for correspondence:
Urs Maurer
Associate Professor
Rm 325, Sino Building
The Chinese University of Hong Kong
Phone: (+852) 39431035