Full title: Adaptation Patterns and Their Associations with Mismatch Negativity: A Electroencephalogram Study with Controlled Expectations
 Running title: Adaptation and MMN
Authors: Brian W. L. WONG1,2, Shuting HUO1,3, Urs MAURER1,4,5
 1 Department of Psychology, The Chinese University of Hong Kong, Hong Kong, China
2 BCBL, Basque Center on Brain, Language and Cognition, Donostia-San Sebastián, Spain
3 Department of Applied Social Sciences, The Hong Kong Polytechnic University, Hong Kong, China
4 Brain and Mind Institute, The Chinese University of Hong Kong, Hong Kong, China
5 Centre for Developmental Psychology, The Chinese University of Hong Kong, Hong Kong, China
 Data availability statement: The data that support the findings of this study are openly available in OSF at http://doi.org/10.17605/OSF.IO/3XYFC  
 Word count: 7,608
 Figure count: 6
 Keywords: Adaptation, expectation, electroencephalogram (EEG), mismatch negativity (MMN), repetition positivity (RP)
 Funding: This work was supported by the General Research Fund of the Research Grants Council of Hong Kong awarded to the corresponding author (RGC-GRF 14600919).
 Conflict of interest: None
Ethics approval statement: This study was approved by The Joint Chinese University of Hong Kong–New Territories East Cluster Clinical Research Ethics Committee (The Joint CUHK-NTEC CREC) (reference no.: 2019.048)
Author Note
Brian W. L. WONG   https://orcid.org/0000-0002-0519-6116      b.wong@bcbl.eu
Shuting HUO              https://orcid.org/0000-0001-5067-8491      shuting.huo@polyu.edu.hk
Urs MAURER             https://orcid.org/0000-0002-4156-8597      umaurer@cuhk.edu.hk
Address for correspondence: 
Urs Maurer
Associate Professor
Rm 325, Sino Building
The Chinese University of Hong Kong
Email: umaurer@cuhk.edu.hk
Phone: (+852) 39431035