Supplementary Materials include:
Fig. S1. The XPS characterization of MOFs.
Fig. S2. The XRD spectrum of MOFs.
Fig. S3. The characterizations of the 2D Zn2(ZnTCPP) MOFs-PMMA/Pentacene structure.
Fig. S4. The Ar-ion etching XPS characterization of MOFs.
Fig. S5. The AFM characterizations.
Fig. S6. The optical properties of the MOFs.
Fig. S7. The device performance.
Fig. S8. The comparison between the device with/without 2D MOF.  
Fig. S9. The PPF curves.       
Fig. S10. The device performance under various temperatures.
Fig. S11. The KPFM characterization.                 
Fig. S12. The potentiation and depression of the device.
Table S1. The parameters for simulation.